Manufacturing Technology Today

Rina Sharma ¹, Usha Kiran ¹, V. N. Ojha ¹, Anil Kumar ¹

Affiliations
1 National Physical Laboratory (CSIR), New Delhi-110012, IN

Abstract

The surface quality of mass standards is on important parameter. Surface roughness of moss standards is important as it is known to be related to contamination with pollutants (such as adsorbed water vapors etc.) and the stability of moss standards. There is a growing interest in surface roughness measurement among mass metrologist. In the present paper we present the work carried out to investigate the roughness of mass standards and try to correlate it with stability of mass standards.

Keywords

Roughness, Mass Standards, White Light Interferometry.

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